MX 2013

Automatable geometry gauge for thin and standard 200 mm or 300 mm silicon wafers.

The MX2013 works as semi-automated stand-alone station. With its 37 sensor pairs it gauges 300mm wafers within 50 seconds. It controls thickness, bow and warp in high resolution (Corresponds with Sori). System optional available for 200mm wafer measuring. Comes with our powerful MX-NT operating software.


Measurement types

Thickness Flatness (TTV) Bow Warp

Features

Wafer Diameter 200 mm, 300 mm
Thickness accurancy ±1 µm
Resolution 0.1 µm
Thickness range 100–750 µm
Automatic yes
Software MX-NT
Warp characteristics Sori

WHICH TOOL
fits my needs?

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Peter Michel

+49 (0)721 83118-17
sales(at)eh-metrology.com

 

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