MX 2012
High precision chip production geometry gauge for 300 mm silicon wafers.
Automatable geometry gauge for thin and standard 200 mm or 300 mm silicon wafers.
The MX2013 works as semi-automated stand-alone station. With its 37 sensor pairs it gauges 300mm wafers within 50 seconds. It controls thickness, bow and warp in high resolution (Corresponds with Sori). System optional available for 200mm wafer measuring. Comes with our powerful MX-NT operating software.
| Wafer Diameter | 200 mm, 300 mm |
| Thickness accurancy | ±1 µm |
| Resolution | 0.1 µm |
| Thickness range | 100–750 µm |
| Automatic | yes |
| Software | MX-NT |
| Warp characteristics | Sori |
You have questions, wishes or an order?
We will be happy to consult you personally.
