MX 203-8-37-B

Fast contactless geometry gauge for thin 150 mm and 200 mm silicon wafers.

High throughput: the MX203-8-37-B gauges with its 37 sensor pairs every wafer within max. 8 seconds. It controls thickness, bow and warp after back side grinding. Flexible wafer size adjustment by various centering-frames. Comes with our powerful MXNT operating software.


Measurement types

Thickness Flatness (TTV) Bow Warp

Features

Wafer Diameter 150 mm, 200 mm
Thickness accurancy ±0.5 µm
Resolution 50 nm
Thickness range 200–700 µm
Automatic no
Software MX-NT
Warp characteristics Sori

WHICH TOOL
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Peter Michel

+49 (0)721 83118-17
sales(at)eh-metrology.com

 

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