MX 204-8-21-V

Automatable geometry gauge for thin 150 mm and 200 mm silicon wafers.

The MX204-8-21-V works as manually loaded stand-alone tool as well as fully integrated in automated robot systems. With its 21 sensor pairs it controls thickness, bow and warp after back side grinding. Throughput at least 80 wafers per hour. Different wafer sizes can be used without changeover thanks to the upstream centering station. Comes with our powerful MX-NT Software.


Measurement types

Thickness Flatness (TTV) Bow Warp

Features

Wafer Diameter 150 mm, 200 mm
Thickness accurancy ±1 µm
Resolution 0.1 µm
Thickness range 100–700 µm
Automatic yes
Software MX-NT
Warp characteristics Sori

WHICH TOOL
fits my needs?

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Peter Michel

+49 (0)721 83118-17
sales(at)eh-metrology.com

 

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